Jds-uniphase Module-E 10G User Manual download pdf (Page 2)

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WEBSITE: www.jdsu.com

COMMUNICATIONS TEST &

MEASUREMENT SOLUTIONS

Applications

10GigE LAN, 10G FC Testing

10GigE LAN BERT with A/-B seed•

10G FC BERT with A-/B-seed •

10GigE LAN with MAC/IP traﬃc•

Sophisticated PCS layer testing with •

dynamic block errors, coding statistics and

block capture

256 MAC/IP Flows with 256 independent •

ﬁlters

10 mixed VLAN / MPLS tags•

Enhanced Ethernet Frames VPLS, MAC-in-•

MAC

QoS, service disruption, packet jitter, BERT •

per ﬂow

Tree diﬀerent types of packet jitter: •

Instantaneous, RFC3550 and absolute

Online hitless traﬃc control•

IPv4/IPv6 and packet capture•

10GigE WAN, 10G SONET/SDH Testing

OC-192c/STM-64c BERT and WAN•

Full 10GigE functionality in WAN as per •

10GigE LAN

Dynamic error/alarm insertion including •

pulse bursts

Best-in-class service disruption with high •

level of details

All pointer sequences•

Performance monitoring G.826/828/829•

Byte capture all SOH/TOH bytes•

Multi-Channel 10G High Order

Generation and analysis of up to 192xSTS-•

1/64xAU-3/4

Analysis of BER, service disruption, errors, •

alarms in all channels

Mixed mappings•

STS-1 /3c/6c/9c/12c/24c/48c/192c•

VC-4-2c/3c/4c/8c/16c/64c•

Enhanced through mode with error and •

alarm injection in multiple channels

Dynamic error/alarm insertion including •

pulse bursts

Best-in-class service disruption with high •

level of details

Byte capture all SOH/TOH bytes•

OTN OTU2 10/11G Testing

Standard and overclocked OTU2 line rates•

OTN wrapper/dewrapper testing (RX <> •

TX rates)

Support of all TCM layers•

Transfer delay and service disruption•

Unique FEC stress testing with walking •

pattern

OH byte capture•

Dynamic error/alarm insertion including •

pulse bursts

Stressed Eye and Jitter/Wander Testing

(in preparation)

Stressed eye (SE) generation at all •

unframed and framed rates at 1550 nm

User-adjustable OMA, ER, SJ, and VECP•

Stressed receiver sensitivity (SRS) test with •

pass/fail result using bit error ratio (BER)

measurement

Jitter/wander generation and analysis for •

all line rates

Framed and unframed signals with optical •

and diﬀerential electrical interfaces

TDEV noise wander generation for all •

interfaces incl. DS1/E1

Automatic measurements MTJ, FMTJ, JTF, •

MTW, WTF

Online TIE/MTIE/TDEV wander •

measurements

Multiple Applications

for Multiple Users

Combining broadest range of technol-

ogies with real multi-user capabilities

the JDSU ONT-503/506/512 is the lab

tool enabling users to get the most out

of their testing time.

Highly developed Tcl- and C-libraries

together with LW CVI drivers facilitate

and speed the development of auto-

mated test scripts

40/43G with Jitter

For analyzing electrical and optical

40/43 Gb/s SDH/SONET/OTU-3 systems

including jitter and wander functional-

ity in one unit.

High Accurate Jitter up to 10.7 Gb/s

For qualifying electrical and optical

inputs and outputs of systems 155M up

to 10.7 Gb/s. The jitter receiver provides

the highest accuracy on the market.

The solution complies to ITU-T O.172

Appendix VII and VIII. Wander measure-

ments are processes with up to 1000

samples/s.

OTN all rates

For system testing with all G.709 map-

pings OTU-1/2/3 and overclocked

OTU-2. Various clients are supported

together with the wrapper/de-wrapper

test functionality

Ethernet up to 10GigE

For testing native Ethernet inter-

faces 10/100/1000M and GigE and

verifying real interworking with the

NewGen solution. 10GigE LAN/WAN

allows enhanced testing on PCS and

MAC/IP layers.

MultiChannel Low Order

Analyses all 1000 channels of a 2.5 Gb/s

bandwidth in 2.5 and 10 Gb/s signals.

Uses multiple service disruption mea-

surements to see all detailed effects

during switching processes in SDH/

SONET systems. No blind spots.

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